Linear and nonlinear optical properties of SnS thermally evaporated thin films
Abstract
Thickness relying on linear and nonlinear optical properties of tin sulfide thin films has been
studied. Tin sulfide thin films were grown utilizing thermal evaporation technique. SnS films
have polycrystalline nature with orthorhombic structure shown from X-ray diffraction study.
Transmission and reflection spectrum has been taken utilizing VIS-NIR spectrophotometer in the
wavelength range 300–1100 nm. Linear optical properties of thin films indicate let direct and
indirect transition type and the band gap increased with film thickness. The third order nonlinear
optical susceptibility χ3 and nonlinear refractive index n2 has been determined by mathematical
calculation.
Keywords
Optical characteristics of SnS Thermal evaporated thin films Nonlinear refractive index Linear optical susceptibility Absorption coefficient Direct energy gap