Characterization and linear/non-linear optical properties of polypyrrole/NiO for optoelectronic devices

In this study, PPy/NiOX composites with different contents of NiOX are fabricated by polymerization fabrication method to be used in optoelectronics. The FTIR, XPS and XRD, are investigated the effect of NiOX on the structural characteristics of PPy films. Meanwhile, the morphology of PPy has been changed after introducing NiOX as investigated by FE-SEM. The TEM of the PPy/NiOX showed the NiOX particles size is of 140 to 280 nm. The optical gap, absorption edge, and Urbach energy of PPy and PPy/NiOX have been recorded. The band gap reduces from 1.85 eV for PPy to 1.89, 1.8, 1.76 eV respectively for PPy-NiOX-I, PPy-NiOX-II, and PPy-NiOX-III. And the Urbach tail is changed from 2.5 eV for PPy respectively to 1.87, 3.3, and 4.1 eV. Furthermore, optical parameters such as extinction coefficient were determined. The plasma frequency (WP) is changed from 0.08x1014 Hz for PPy to 0.13 × 1014, 0.011 × 1014, and 0.01 × 1014 Hz for PPy/NiOX-I, PPy/NiOX-II and PPy/NiOX-III, respectively. According to the findings, PPy/NiO films have great potential as a material in optoelectronics.