Structural characteristics and dielectric properties of irradiated polyvinyl alcohol/sodium iodide composite films

This study, sodium iodide (NaI) is doped with polyvinyl alcohol (PVA) to prepare the PVA/NaI films. The films were irradiated by argon with beam fluence (50x1016, 100x1016, and 150x1016 ions.cm−2). The composite structural were studied by XRD, FTIR and photoluminescence methods. Moreover, the SRIM/TRIM simulations is used to record the changes in the samples. The FTIR data showed that the PVA/NaI peak intensity is shifted by ion irradiations due to the interaction of PVA and NaI. In addition, the changes in surface morphology, which recorded by SEM, indicated relative modifications of the irradiated films. The electrical characteristics were measured with applied frequency of 50 Hz and 5 MHz. The dielectric constant value at frequency 100 Hz is 40 for PVA/NaI and reached to 70 and 85 respectively for irradiated with fluence 50x1016 and 100x1016 ions.cm−2. Moreover, the dielectric loss, at frequency 100 Hz, was decreased from 70 for blank sample to 25 for the irradiated film with 150x1016 ions.cm−2. This change in dielectric parameters is due argon irradiation. The results investigate the dielectric behavior of treated PVA/NaI films were modified to be more applicable in various devices.