A p‑Si/CoPc Hybrid Photodiode System for Looking at Frequency and Temperature Dependence on Dielectric Relaxation and AC Electrical Conductivity
Abstract
In this work, a heterojunction of Al/p-Si/CoPc/Au was fabricated using the thermal evaporation technique by depositing
CoPc on the p-Si. Complex impedance spectroscopy was employed to investigate the impedance characteristics and the full
band profile measurements of the fabricated heterojunction. Arrhenius fitting of double relaxation operations was utilized to
determine the activation energy of the tested device.
Keywords
p-Si/CoPc · frequency and temperature dependence · complex impedance spectroscopy (CIS)