Annealing temperature effect to optimize the optical properties of SnS thin films
Abstract
The influence of annealing temperature in the range 400–550 nm on the SnS thin
films, synthesized via thermal evaporation method, is investigated. The structure of tin sulfide
annealed films is examined through X-ray diffraction (XRD), revealing crystalline nature
with the orthorhombic structure of the main peak (111) at 2θ 31.38Å. Micro-strain and ´
dislocation density are decreased as the annealing temperature increased.
Keywords
Annealing, energy gap